Elevating thermal shock device
A lift-type two-zone test area that applies uniform temperature stress to the sample.
A two-zone thermal shock device that perfectly fits domestic and international standard tests such as MIL, IEC, and JASO. 【Features】 Achieves high performance required for standard tests! ● The two zones (+150℃ and -65℃) shorten the temperature recovery time of samples. * With a set temperature of +150℃ and -65℃, for a 10kg plastic molded IC sample, the temperature recovery time was achieved within 15 minutes. ● Compatible with standard tests including MIL-STD-883. * Supports testing standards such as MIL-STD-883 and JIS C 60068-2-14-Na. ● Stable temperature distribution performance. * Airflow within the test area is evenly distributed, achieving excellent temperature distribution performance. This provides uniform thermal stress to the samples, minimizing variations in test results between samples. ● The liftable two-zone test area reduces testing time. ● Equipped with a sample temperature trigger for measuring sample temperature.
